SEMICONDUCTOR-INDUSTRY5 MIN READ
Tell Design the Test Coverage Gap Without Starting a Fight
Use SBI to raise a semiconductor test coverage concern with a design counterpart.
Raj R Design lead S Situation B Behavior I Impact Release risk 2 days before review The moment The new scan mode has weak coverage, and the design lead believes the release is low risk. The first sentence determines whether this becomes shared risk or cross-functional blame. 42% toggle coverage on new mode 2d until release review
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