Build a One-Page A3 for a Wafer Sort Escape
Use A3 problem solving to structure a wafer sort escape investigation.
A customer return shows parts that should have failed wafer sort, but the investigation is spread across emails, maps, and test logs. A3 problem solving: background, current condition, target, root cause, countermeasure, plan, follow-up The common trap is writing a beautiful timeline while never stating the exact defect, target condition, or evidence-backed root cause. Background State why this matters: Product Q customer incoming screen found marginal IDDQ units after wafer sort release. Background gives business and customer context without becoming the whole story. Current condition Show lots W23-W27, test program revision B.14, affected bin, retest path, and the count of…
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