Run a Lightweight FMEA on a New Probe Card
Apply FMEA steps to a semiconductor probe-card introduction.
A new high-throughput probe card is ready for release, but its failure modes have not been explicitly mapped. FMEA: function, failure mode, effect, cause, current control, priority action The common trap is scoring a generic risk called 'probe card issue' instead of naming specific ways the card can create false data, wafer damage, or missed defects. Function The probe card must make stable electrical contact across the wafer without damaging pads and without biasing pass/fail decisions. Function defines what loss of function means. Without it, failure modes become vague. Failure mode and effect Contact resistance drift during long lots could…
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