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SEMICONDUCTOR-INDUSTRY5 MIN READ

Treat Yield Loss as a Process, Not a Mystery

Use the DMAIC sequence to structure a yield-loss investigation.

Do not let the first plausible theory become the project plan. Define the real defect Name the product, time window, failure mode, and boundary. A vague 'yield is down' creates a vague investigation. Measure with trusted cuts Confirm the measurement system, baseline, and segmentation. Split by product, tool, lot start, chamber, reticle, test program, and supplier only where the data supports it. Analyze before improving A correlation is a lead, not a cause. Use history, physics, and cross-functional review to narrow the mechanism. Improve and control Pilot the smallest credible fix, then define the control metric and reaction plan. Without…

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